Temperature dependence of the phase-coherence length in InN nanowires

被引：24

作者：

Bloemers, Ch. ^{[1
]}

Schaepers, Th.

Richter, T.

Calarco, R.

Lueth, H.

Marso, M.

机构：

[1] Res Ctr Julich GmbH, IBN 1, D-52425 Julich, Germany

来源：

APPLIED PHYSICS LETTERS | 2008年 / 92卷 / 13期

关键词：

D O I：

10.1063/1.2905268

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report on low-temperature magnetotransport measurements on InN nanowires, grown by plasma-assisted molecular beam epitaxy. The characteristic fluctuation pattern observed in the conductance was employed to obtain information on phase-coherent transport. By analyzing the root mean square and the correlation field of the conductance fluctuations at various temperatures, the phase-coherence length was determined. (C) 2008 American Institute of Physics.

引用

页数：3

共 24 条

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