Atomic force microscopy investigation of the adhesion between a single polymer sphere and a flat surface

被引:82
作者
Biggs, S [1 ]
Spinks, G
机构
[1] Univ Newcastle, Dept Chem, Callaghan, NSW 2308, Australia
[2] Univ Wollongong, Dept Mat Engn, Wollongong, NSW 2522, Australia
基金
澳大利亚研究理事会;
关键词
particle adhesion; atomic force microscopy; polystyrene; viscoelastic deformation;
D O I
10.1163/156856198X00164
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
Adhesional interaction forces between a single 5 mu m radius polystyrene sphere and an atomically smooth mica surface have been measured using an atomic force microscope. The pull-off force was determined as a function of two factors: the contact time between the surfaces at a constant maximum applied load and the applied lend. Careful analysis of the data in the contact zone revealed that the polystyrene underwent significant non-elastic deformations when the contact times were more than 10 s. These data were rationalized on the basis of viscoelastic deformation of the sphere as the load was applied: the lends used here exceeded the elastic limit for polystyrene. It appears from the data that the exact modelling of the sphere deformation is a complex problem involving both surface asperities and bulk material collapse. The pull-off force was seen to increase both with increasing applied load and with longer contact time. Calculation of the applied forces indicated that plastic deformation was likely, at least at the slower loading rates, and the relationship between the pull-off force and the applied load (P) agreed with a P-1/2 dependence as suggested by Maugis and Pollock. It was concluded that at the applied loads-used here, the surface asperities were effectively 'squeezed out' resulting in an apparent smooth sphere contact.
引用
收藏
页码:461 / 478
页数:18
相关论文
共 30 条
[21]   DETERMINATION OF THE DEPENDENCE OF THE SURFACE FORCE INDUCED CONTACT RADIUS ON PARTICLE RADIUS - CROSS-LINKED POLYSTYRENE SPHERES ON SIO2/SILICON [J].
RIMAI, DS ;
MOORE, RS ;
BOWEN, RC ;
SMITH, VK ;
WOODGATE, PE .
JOURNAL OF MATERIALS RESEARCH, 1993, 8 (03) :662-667
[22]  
RIMAI DS, 1995, FUNDAMENTALS ADHESIO, P1
[23]  
Schaefer D.M., 1995, Fundamentals of Adhesion and Interfaces, P35
[24]   SURFACE FORCE INTERACTIONS BETWEEN MICROMETER-SIZE POLYSTYRENE SPHERES AND SILICON SUBSTRATES USING ATOMIC-FORCE TECHNIQUES [J].
SCHAEFER, DM ;
CARPENTER, M ;
REIFENBERGER, R ;
DEMEJO, LP ;
RIMAI, DS .
JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 1994, 8 (03) :197-210
[25]   SURFACE-ROUGHNESS AND ITS INFLUENCE ON PARTICLE ADHESION USING ATOMIC-FORCE TECHNIQUES [J].
SCHAEFER, DM ;
CARPENTER, M ;
GADY, B ;
REIFENBERGER, R ;
DEMEJO, LP ;
RIMAI, DS .
JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 1995, 9 (08) :1049-1062
[26]   Materialistic difference in macroscopic friction coefficients of sputtered metal oxide thin films deposited on glass [J].
Suzuki, S ;
Ohsaki, H ;
Ando, E .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (03) :1862-1867
[27]   Adhesion of iron oxide to silica studied by atomic force microscopy [J].
Toikka, G ;
Hayes, RA ;
Ralston, J .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1996, 180 (02) :329-338
[28]   INTERACTIONS OF SILICA SURFACES [J].
VIGIL, G ;
XU, ZH ;
STEINBERG, S ;
ISRAELACHVILI, J .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1994, 165 (02) :367-385
[29]   Particle adhesion and removal: A review [J].
Visser, J .
PARTICULATE SCIENCE AND TECHNOLOGY, 1995, 13 (3-4) :169-196
[30]   FUNDAMENTAL MECHANISMS OF INTERFACIAL FRICTION .1. RELATION BETWEEN ADHESION AND FRICTION [J].
YOSHIZAWA, H ;
CHEN, YL ;
ISRAELACHVILI, J .
JOURNAL OF PHYSICAL CHEMISTRY, 1993, 97 (16) :4128-4140