Structures of Al/Si(100) surfaces as determined by scanning tunneling microscopy

被引:6
作者
Zhu, CX
Misawa, S
Tsukahara, S
机构
[1] Tsukuba Inst. for Super Materials, ULVAC JAPAN, Ltd., Tsukuba, Ibaraki 300-26
关键词
D O I
10.1063/1.363296
中图分类号
O59 [应用物理学];
学科分类号
摘要
The structures of Al/Si(100) surfaces with coverages below 0.5 monolayer have been determined using scanning tunneling microscopy (STM). Through careful STM measurements, Al dimers are atomically resolved, where the Al dimer bond is intuitively demonstrated to be parallel to the Si dimer bond. The atomic arrangements at the ends of Al dimer rows have been discussed on the basis of the interpretation of dual-bias STM images. Two possible structures at the end of an Al dimer row are a single atom termination and a dimer termination, depending on whether the Al dimer row ends at a surface defect, respectively. (C) 1996 American Institute of Physics.
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页码:4205 / 4207
页数:3
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