Transmission ion channeling analysis of isolated 60° misfit dislocations -: art. no. 211907

被引：4

作者：

Breese, MBH

Huang, L

Teo, EJ

King, PJC

Wilshaw, PR

机构：

[1] Natl Univ Singapore, Ctr Ion Beam Applicat, Dept Phys, Singapore 117542, Singapore

[2] Rutherford Appleton Lab, Didcot OX11 0QX, Oxon, England

[3] Univ Oxford, Dept Mat, Oxford OX1 3PH, England

来源：

APPLIED PHYSICS LETTERS | 2005年 / 87卷 / 21期

关键词：

D O I：

10.1063/1.2135393

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

High-contrast transmission channeling images and linescans of isolated bunches and individual 60 degrees misfit dislocations in thick partially relaxed Si1-xGex/Si layers are presented. Changes in dislocation contrast with tilt angle are explained using a model of planar dechanneling by the two-edge components of 60 degrees dislocations. By careful analysis of the tilting contrast, all of the four possible combinations of the two-edge components of the Burger's vector of 60 degrees dislocations may be distinguished. (c) 2005 American Institute of Physics.

引用

页码：1 / 3

页数：3

共 19 条

[1] Observation of many coherent oscillations for MeV protons transmitted through stacking faults [J].