Phase in Nanooptics

被引：23

作者：

Carney, P. Scott ^{[1
,2
]}

Deutsch, Bradley ^{[3
]}

Govyadinov, Alexander A. ^{[4
]}

Hillenbrand, Rainer ^{[4
,5
]}

机构：

[1] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA

[2] Univ Illinois, Beckman Inst Adv Sci & Technol, Urbana, IL 61801 USA

[3] Univ Rochester, Inst Opt, Rochester, NY 14627 USA

[4] CIC NanoGUNE Consolider, E-20018 Donostia San Sebastian, Spain

[5] Basque Fdn Sci, IKFRBASQUE, E-48011 Bilbao, Spain

来源：

ACS NANO | 2012年 / 6卷 / 01期

关键词：

SCATTERING; MICROSCOPY; INTERFERENCE; AMPLITUDE;

D O I：

10.1021/nn205008y

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Quantitative phase measurements in Imaging, microscopy, and nanooptics provide information not carried in amplitude measurements alone. In this issue of ACS Nano, Honigstein et al. present a new method in phase measurement. In this Perspective, we comment on this work and more broadly on the emerging role of phase and phase measurements in nanooptics.

引用

页码：8 / 12

页数：5

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