X-ray studies of aligned magnetic stripe domains in perpendicular multilayers

被引:80
作者
Hellwig, O
Denbeaux, GP
Kortright, JB [1 ]
Fullerton, EE
机构
[1] Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA
[2] Hitachi Global Storage Technol, San Jose Res Ctr, San Jose, CA 95120 USA
关键词
magnetic domains; perpendicular magnetic anisotropy; X-ray scattering; magnetic microscopy; magnetic thin films;
D O I
10.1016/S0921-4526(03)00282-5
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We have investigated the stripe domain structure and the magnetic reversal of perpendicular Co/Pt-based multilayers at room temperature using magnetometry, magnetic imaging and magnetic X-ray scattering. In-plane field cycling aligns the stripe domains along the field direction. In magnetic X-ray scattering the parallel stripe domains act as a magnetic grating resulting in observed Bragg reflections up to fifth order. We model the scattering profile to extract and quantify the domain as well as domain wall widths. Applying fields up to similar to 1.2 kOe perpendicular to the film reversibly changes the relative width of up versus down domains while maintaining the overall stripe periodicity. Fields above 1.2 kOe introduce irreversible changes into the domain structure by contracting and finally annihilating individual stripe domains. We compare the current results with modeling and previous measurements of films with perpendicular anisotropy. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:136 / 144
页数:9
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