Revealing the hidden atom in graphite by low-temperature atomic force microscopy

被引:131
作者
Hembacher, S
Giessibl, FJ
Mannhart, J
Quate, CF
机构
[1] Univ Augsburg, Inst Phys Electron Correlat & Magnet Expt Phys 6, D-86135 Augsburg, Germany
[2] Stanford Univ, Ginzton Lab, Stanford, CA 94305 USA
关键词
D O I
10.1073/pnas.2134173100
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Carbon, the backbone material of life on Earth, comes in three modifications: diamond, graphite, and fullerenes. Diamond develops tetrahedral sp(3) bonds, forming a cubic crystal structure, whereas graphite and fullerenes are characterized by planar sp(2) bonds. Polycrystalline graphite is the basis for many products of everyday life: pencils, lubricants, batteries, arc lamps, and brushes for electric motors. In crystalline form, highly oriented pyrolytic graphite is used as a diffracting element in monochromators for x-ray and neutron scattering and as a calibration standard for scanning tunneling microscopy (STM). The graphite surface is easily prepared as a clean atomically flat surface by cleavage. This feature is attractive and is used in many laboratories as the surface of choice for "seeing atoms." Despite the proverbial ease of imaging graphite by STM with atomic resolution, every second atom in the hexagonal surface unit cell remains hidden, and STM images show only a single atom in the unit cell. Here we present measurements with a low-temperature atomic force microscope with pico-Newton force sensitivity that reveal the hidden surface atom.
引用
收藏
页码:12539 / 12542
页数:4
相关论文
共 30 条
[1]   ATOMIC RESOLUTION WITH THE ATOMIC FORCE MICROSCOPE ON CONDUCTORS AND NONCONDUCTORS [J].
ALBRECHT, TR ;
QUATE, CF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :271-274
[2]   FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].
ALBRECHT, TR ;
GRUTTER, P ;
HORNE, D ;
RUGAR, D .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673
[3]   A STUDY OF GRAPHITE SURFACE WITH STM AND ELECTRONIC-STRUCTURE CALCULATIONS [J].
BATRA, IP ;
GARCIA, N ;
ROHRER, H ;
SALEMINK, H ;
STOLL, E ;
CIRACI, S .
SURFACE SCIENCE, 1987, 181 (1-2) :126-138
[4]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[5]   ENERGY-DEPENDENT STATE-DENSITY CORRUGATION OF A GRAPHITE SURFACE AS SEEN BY SCANNING TUNNELING MICROSCOPY [J].
BINNIG, G ;
FUCHS, H ;
GERBER, C ;
ROHRER, H ;
STOLL, E ;
TOSATTI, E .
EUROPHYSICS LETTERS, 1986, 1 (01) :31-36
[6]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[7]  
CEHN CJ, 1993, INTRO SCANNING TUNNE
[8]   INTERACTION FORCE DETECTION IN SCANNING PROBE MICROSCOPY - METHODS AND APPLICATIONS [J].
DURIG, U ;
ZUGER, O ;
STALDER, A .
JOURNAL OF APPLIED PHYSICS, 1992, 72 (05) :1778-1798
[9]   ATOM-SELECTIVE IMAGING OF THE GAAS(110) SURFACE [J].
FEENSTRA, RM ;
STROSCIO, JA ;
TERSOFF, J ;
FEIN, AP .
PHYSICAL REVIEW LETTERS, 1987, 58 (12) :1192-1195
[10]  
FEYNMAN RP, 1963, FEYNMAN LECT PHYSICS