Optical constants of zinc sulfide films determined from transmittance measurements

被引：42

作者：

Durrani, SMA ^{[1
]}

Al-Shukri, AM ^{[1
]}

Iob, A ^{[1
]}

Khawaja, EE ^{[1
]}

机构：

[1] King Fahd Univ Petr & Minerals, Res Inst, Ctr Appl Phys Sci, Dhahran 31261, Saudi Arabia

来源：

THIN SOLID FILMS | 2000年 / 379卷 / 1-2期

关键词：

optical properties; semiconductors; tungsten bronzes;

D O I：

10.1016/S0040-6090(00)01539-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The optical constants of thermally evaporated thin films of ZnS have been determined by measurements of transmittance at normal incidence from two films of different thickness. A single-layer model has been successfully used for the films. The results are compared with those obtained earlier for thermally evaporated ZnS films using reflectance and transmittance measurements (where a two-layer model for a ZnS film was used). The advantage of the present method over the earlier one is the readily available measurement facilities. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：199 / 202

页数：4

共 14 条

[11] Simple method for determining the optical constants of thin metallic films from transmittance measurements [J].

Khawaja, EE ;

Durrani, SMA ;

Al-Shukri, AM .

THIN SOLID FILMS, 2000, 358 (1-2) :166-171

[12] Depth profiling of inhomogeneous zirconia films by optical and Rutherford backscattering spectrometric techniques [J].

Khawaja, EE ;

Durrani, SMA ;

Daous, MA .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1999, 32 (04) :388-394

[13] OPTICAL AND CRYSTALLINE INHOMOGENEITY IN EVAPORATED ZIRCONIA FILMS [J].

KLINGER, RE ;

CARNIGLIA, CK .

APPLIED OPTICS, 1985, 24 (19) :3184-3187

[14] ELLIPSOMETRIC STUDIES ON ZINC-SULFIDE THIN-FILMS GROWN BY ATOMIC LAYER EPITAXY [J].

OIKKONEN, M .

JOURNAL OF APPLIED PHYSICS, 1987, 62 (04) :1385-1393

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