Interfacial roughness of partially correlated metallic multilayers studied by non-specular X-ray reflectivity

被引:4
作者
Paniago, R
Homma, H
Chow, PC
Reichert, H
Moss, SC
Barnea, Z
Parkin, SSP
Cookson, D
机构
[1] UNIV HOUSTON,DEPT PHYS,HOUSTON,TX 77204
[2] UNIV MELBOURNE,SCH PHYS,PARKVILLE,VIC 3052,AUSTRALIA
[3] IBM CORP,DIV RES,ALMADEN RES CTR,SAN JOSE,CA 95120
[4] AUSTRALIAN NUCL SCI & TECHNOL ORG,MENAI,NSW 2234,AUSTRALIA
来源
PHYSICA B | 1996年 / 221卷 / 1-4期
基金
美国国家科学基金会;
关键词
D O I
10.1016/0921-4526(95)00898-5
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Using a two-dimensional image plate detector we measured the non-specular X-ray reflectivity from (Ni-0.81 Fe-0.19)/Au metallic multilayers. The image plate pattern consists of periodic diffuse sheets which arise from the coherence of the roughness between different interfaces, and are strongest at the position of the Bragg peaks. We analyze the expression for the diffuse scattering cross-section derived from the distorted-wave Born approximation and separate the coherent and incoherent contributions, This allows us to determine the interface roughness parameters, assuming it to be self-affine. From the line shape of the diffuse sheets we determine the partial replication of the roughness for different length scales.
引用
收藏
页码:10 / 12
页数:3
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