SCANNING ELECTRON MICROSCOPY AND ATOMIC FORCE MICROSCOPY OF CHITOSAN COMPOSITE FILMS

被引：16

作者：

Cardenas, Galo ^{[1
]}

Anaya, Paola ^{[1
]}

Del Rio, Rodrigo ^{[2
]}

Schrebler, Ricardo ^{[2
]}

von Plessing, Carlos ^{[3
]}

Schneider, Mark ^{[4
]}

机构：

[1] Univ Concepcion, Dept Polimeros, Fac Ciencias Quim, Concepcion, Chile

[2] Pontificia Univ Catolica Valparaiso, Inst Quim, Valparaiso, Chile

[3] Univ Concepcion, Fac Farm, Concepcion, Chile

[4] Univ Saarland, Abt Biopharm & Pharmazeut Technol, Saarbrucken, Germany

来源：

JOURNAL OF THE CHILEAN CHEMICAL SOCIETY | 2010年 / 55卷 / 03期

关键词：

Chitosan; composite film; morphology; rugosity; DERIVATIVES; CHITIN;

D O I：

10.4067/S0717-97072010000300017

中图分类号：

O6 [化学];

学科分类号：

070301 [无机化学];

摘要：

Chitosan composite films were obtained from acetic or lactic acid chitosan solutions and additives such as glycerol, oleic acid, linoleic acid, polyoxyethylenesorbitan monolaureate (Tween 20) and polyoxyethylenesorbitan monooleate (Tween 80) in order to sec the influence of the additive on the film formation, microstructure and morphology. The composite films obtained were observed by Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) in order to evaluate the different morphology dependent upon the additives. Both SEM and AFM showed the additive influence on the rugosity and morphology of the film.

引用

页码：352 / 354

页数：3

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