Role of the substrate thickness for the structural properties of organic-organic hetero structures

被引:8
作者
de Oteyza, Dimas G.
Barrena, Esther
Sellner, Stefan
Osso, J. Oriol
Dosch, Helmut
机构
[1] Max Planck Inst Met Res, D-70569 Stuttgart, Germany
[2] Univ Stuttgart, Inst Theoret & Angew Phys, D-70550 Stuttgart, Germany
[3] CSIC, Inst Ciencia Mat Barcelona, Bellaterra 08193, Spain
关键词
atomic force microscopy; in situ characterization; molecular beam epitaxy; X-ray scattering; growth; self-assembly; heterojunctions; organic semiconductors;
D O I
10.1016/j.susc.2007.04.180
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
F(16)CuPc deposited on pentacene is characterized by the coexistence of two different configurations: F(16)CuPc is found in the standing up phase ("s-configuration") on top of pentacene terraces and in a lying down phase ("l-configuration") at pentacene step edges. By combining AFM and grazing incidence X-ray diffraction we show that the ratio between F(16)CuPc in l- and s-configurations increases with thickness of the pentacene substrate film, demonstrating the role of the pentacene steps as nucleation centers for the F(16)CuPc l-configuration. Experiments performed with ultra-thin pentacene thicknesses disclose that the F(16)CuPc l-configuration does not grow on top of the first and second pentacene layers, pointing to the action of long-range interactions with the substrate. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:4117 / 4121
页数:5
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