Hole-injection barrier in pentacene field-effect transistor with Au electrodes modified by C16H33SH

被引:26
作者
Kawasaki, Naoko [1 ]
Ohta, Yohei
Kubozono, Yoshihiro
Fujiwara, Akihiko
机构
[1] Okayama Univ, Surface Sci Res Lab, Okayama 7008530, Japan
[2] Japan Adv Inst Sci & Technol, Ishikawa 9231292, Japan
关键词
D O I
10.1063/1.2789699
中图分类号
O59 [应用物理学];
学科分类号
摘要
Field-effect transistor with thin films of pentacene has been fabricated with Au electrodes modified by 1-hexadecanethiol (C16H33SH), and the hole-injection barriers have been determined from the temperature dependence of output properties on the basis of the thermionic emission model for double Schottky barriers. The large tunneling barriers are formed by the insulating C16H33SH at the interfaces between the Au electrodes and pentacene thin films. (c) 2007 American Institute of Physics.
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页数:3
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