Ambipolar operation of fullerene field-effect transistors by semiconductor/metal interface modification

被引:46
作者
Nishikawa, T
Kobayashi, S
Nakanowatari, T
Mitani, T
Shimoda, T
Kubozono, Y
Yamamoto, G
Ishii, H
Niwano, M
Iwasa, Y
机构
[1] Tohoku Univ, Mat Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan
[2] Japan Sci & Technol Corp, CREST, Kawaguchi 3330012, Japan
[3] Japan Adv Inst Sci & Technol, Tatsunokuchi, Ishikawa 923129, Japan
[4] SEIKO EPSON Corp, Technol Platform Res Ctr, Fujimi, Nagano 3990293, Japan
[5] Okayama Univ, Dept Chem, Okayama 7008530, Japan
[6] Tohoku Univ, Res Inst Elect Commun, Sendai, Miyagi 9808577, Japan
关键词
D O I
10.1063/1.1903109
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report an ambipolar operation in field-effect transistors of C-60 and metallofullerene Dy @ C-82 by modification of semiconductor/metal electrode interface with perfluoroalkylsilane (FAS) molecules. Kelvin probe experiments revealed that the work function of the gold surface modified with FAS molecules increased by 0.55 eV as compared to the untreated gold. Hole injection into fullerenes is qualitatively understood in terms of this work-function change induced by the FAS molecules. The present results indicate that the charge injection from electrodes to organic semiconductors can be controlled simply by modification of semiconductor/metal interface without changing materials themselves. (c) 2005 American Institute of Physics.
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页数:5
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