DX centers in CdTe: A density functional study

被引:11
作者
Du, Mao-Hua [1 ,2 ]
机构
[1] Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USA
[2] Oak Ridge Natl Lab, Div Mat Sci & Technol, Ctr Radiat Detect Mat & Syst, Oak Ridge, TN 37831 USA
关键词
D O I
10.1063/1.2920203
中图分类号
O59 [应用物理学];
学科分类号
摘要
DX centers induced by both group-III and group-VII donors in CdTe are studied using density functional calculations. The results show that, for group-VII donors, the DX centers with a cation-cation bond (alpha- and beta-CCB-DX centers) are more stable than the previously proposed broken-bond DX (BB-DX) center and the beta-CCB-DX center is the most stable. The stability trend found for the CCB-DX centers for different donors in CdTe is consistent with that for GaAs and GaSb, which suggests a general rule that the CCB-DX centers are favored for small donor atoms on anion site especially for semiconductors with large anion size. (C) 2008 American Institute of Physics.
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页数:3
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