Subatomic deformation driven by vertical piezoelectricity from CdS ultrathin films

被引：81

作者：

Wang, Xuewen ^{[1
,2
]}

He, Xuexia ^{[1
]}

Zhu, Hongfei ^{[3
,4
]}

Sun, Linfeng ^{[5
]}

Fu, Wei ^{[1
]}

Wang, Xingli ^{[6
]}

Hoong, Lai Chee ^{[1
]}

Wang, Hong ^{[1
]}

Zeng, Qingsheng ^{[1
]}

Zhao, Wu ^{[1
]}

Wei, Jun ^{[7
]}

Jin, Zhong ^{[3
,4
]}

Shen, Zexiang ^{[5
]}

Liu, Jie ^{[3
,4
,8
]}

Zhang, Ting ^{[2
]}

Liu, Zheng ^{[6
,9
,10
]}

机构：

[1] Nanyang Technol Univ, Sch Mat Sci & Engn, 50 Nanyang Ave, Singapore 639798, Singapore

[2] Chinese Acad Sci, Suzhou Inst Nanotech & Nanobion, Int Lab Adapt Bionanotechnol i Lab, Suzhou 215123, Peoples R China

[3] Nanjing Univ, Minist Educ, Key Lab Mesoscop Chem, Nanjing 210093, Jiangsu, Peoples R China

[4] Nanjing Univ, Sch Chem & Chem Engn, Collaborat Innovat Ctr Chem Life Sci, Nanjing 210093, Jiangsu, Peoples R China

[5] Nanyang Technol Univ, Sch Phys & Math Sci, 21 Nanyang Link, Singapore 637371, Singapore

[6] Nanyang Technol Univ, Sch Elect & Elect Engn, Ctr Micro Nanoelect NOVITAS, Singapore 639798, Singapore

[7] Singapore Inst Mfg Technol, 71 Nanyang Dr, Singapore 638075, Singapore

[8] Duke Univ, Dept Chem, Durham, NC 27708 USA

[9] Nanyang Technol Univ, Sch Mat Sci & Engn, Ctr Programmable Mat, 50 Nanyang Ave, Singapore 639798, Singapore

[10] CINTRA CNRS NTU THALES, UMI 3288, Res Techno Plaza,50 Nanyang Dr, Singapore 637553, Singapore

来源：

SCIENCE ADVANCES | 2016年 / 2卷 / 07期

基金：

中国国家自然科学基金; 新加坡国家研究基金会;

关键词：

OPTICAL-PROPERTIES; BAND-GAP; NANOPLATELETS; NANOCRYSTALS; CONSTANTS; GROWTH; CHARGE;

D O I：

10.1126/sciadv.1600209

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

070301 [无机化学]; 070403 [天体物理学]; 070507 [自然资源与国土空间规划学]; 090105 [作物生产系统与生态工程];

摘要：

Driven by the development of high-performance piezoelectric materials, actuators become an important tool for positioning objects with high accuracy down to nanometer scale, and have been used for a wide variety of equipment, such as atomic force microscopy and scanning tunneling microscopy. However, positioning at the subatomic scale is still a great challenge. Ultrathin piezoelectric materials may pave the way to positioning an object with extreme precision. Using ultrathin CdS thin films, we demonstrate vertical piezoelectricity in atomic scale (three to five space lattices). With an in situ scanning Kelvin force microscopy and single and dual ac resonance tracking piezoelectric force microscopy, the vertical piezoelectric coefficient (d(33)) up to 33 pm.V-1 was determined for the CdS ultrathin films. These findings shed light on the design of next-generation sensors and microelectromechanical devices.

引用

页数：9

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