Selective surface activation of a functional monolayer for the fabrication of nanometer scale thiol patterns and directed self-assembly of gold nanoparticles

被引:78
作者
Fresco, ZM [1 ]
Fréchet, JMJ [1 ]
机构
[1] Univ Calif Berkeley, Dept Chem, Berkeley, CA 94720 USA
关键词
D O I
10.1021/ja052738s
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Application of a voltage bias between the tip of an atomic force microscope (AFM) and a silicon substrate causes the localized modification of a specially designed self-assembled monolayer (SAM), transforming a surface-bound thiocarbonate into a surface-bound thiol. The resulting surface-bound thiols are used to direct the patternwise self-assembly of gold nanoparticles (AuNPs). This methodology is applied to deposit individual AuNPs onto a surface with nanometer precision and to produce 10 nm lines of closely spaced AuNPs that are a single nanoparticle in width. Copyright © 2005 American Chemical Society.
引用
收藏
页码:8302 / 8303
页数:2
相关论文
共 28 条
[1]   Electromagnetic energy transfer and switching in nanoparticle chain arrays below the diffraction limit [J].
Brongersma, ML ;
Hartman, JW ;
Atwater, HA .
PHYSICAL REVIEW B, 2000, 62 (24) :16356-16359
[2]   BASE CATALYSIS IN IMAGING MATERIALS .1. DESIGN AND SYNTHESIS OF NOVEL LIGHT-SENSITIVE URETHANES AS PHOTOPRECURSORS OF AMINES [J].
CAMERON, JF ;
FRECHET, JMJ .
JOURNAL OF ORGANIC CHEMISTRY, 1990, 55 (23) :5919-5922
[3]   DITHIOTHREITOL NEW PROTECTIVE REAGENT FOR SH GROUPS [J].
CLELAND, WW .
BIOCHEMISTRY, 1964, 3 (04) :480-&
[4]   Gold nanoparticles: Assembly, supramolecular chemistry, quantum-size-related properties, and applications toward biology, catalysis, and nanotechnology [J].
Daniel, MC ;
Astruc, D .
CHEMICAL REVIEWS, 2004, 104 (01) :293-346
[5]  
Demers LM, 2001, ANGEW CHEM INT EDIT, V40, P3071, DOI 10.1002/1521-3773(20010817)40:16<3071::AID-ANIE3071>3.0.CO
[6]  
2-S
[7]   AFM-induced amine deprotection:: Triggering localized bond cleavage by application of tip/substrate voltage bias for the surface self-assembly of nanosized dendritic objects [J].
Fresco, ZM ;
Suez, I ;
Backer, SA ;
Fréchet, JMJ .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2004, 126 (27) :8374-8375
[8]   Precise positioning of nanoparticles on surfaces using scanning probe lithography [J].
Garno, JC ;
Yang, YY ;
Amro, NA ;
Cruchon-Dupeyrat, S ;
Chen, SW ;
Liu, GY .
NANO LETTERS, 2003, 3 (03) :389-395
[9]  
Heiney PA, 2000, LANGMUIR, V16, P2651, DOI 10.1021/1a990557w
[10]   The dynamics of electron self-exchange between nanoparticles [J].
Hicks, JF ;
Zamborini, FP ;
Osisek, A ;
Murray, RW .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2001, 123 (29) :7048-7053