AFM-induced amine deprotection:: Triggering localized bond cleavage by application of tip/substrate voltage bias for the surface self-assembly of nanosized dendritic objects

被引：38

作者：

Fresco, ZM ^{[1
]}

Suez, I ^{[1
]}

Backer, SA ^{[1
]}

Fréchet, JMJ ^{[1
]}

机构：

[1] Univ Calif Berkeley, Dept Chem, Berkeley, CA 94720 USA

来源：

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY | 2004年 / 126卷 / 27期

关键词：

D O I：

10.1021/ja047774q

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

An α,α-dimethyl-3,5-dimethoxybenzyloxycarbonyl (DDZ)-protected amine monolayer can be selectively deprotected by the application of a voltage bias from a conducting AFM tip to afford localized nanoscale patterns that can be visualized by self-assembly of dendritic molecular objects with terminal carboxylic acid groups and different aspect ratios. Copyright © 2004 American Chemical Society.

引用

页码：8374 / 8375

页数：2

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