A chemical sensor based on the measurement of differential phase related to surface plasmon resonance

被引:3
作者
Ho, HP [1 ]
Lam, WW [1 ]
Wu, SY [1 ]
Yang, M [1 ]
机构
[1] City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R China
来源
PROCEEDINGS 2001 IEEE HONG KONG ELECTRON DEVICES MEETING | 2001年
关键词
D O I
10.1109/HKEDM.2001.946917
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The optical phase change associated with the surface plasmon resonance (SPR) effect that exists in a glass metal-dielectric stack has been studied using a differential phase imaging technique. A typical prism-coupled SPR setup was constructed and a Mach-Zehnder interferometer was used to perform interferometric analysis between the two orthogonal polarizations in the exit beam. By stepping the phase of the reference arm, one can measure the phase change caused by the SPR effect. Since the reference and signal beams traverse identical optical paths, we expect that this scheme can be more robust in terms of noise immunity. The interrogation area can be enlarged to enable imaging of the SPR sensing surface. Initial phase measurements obtained from a salt-water mixture will be presented to demonstrate the operation of the technique.
引用
收藏
页码:56 / 59
页数:2
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