Delphi: an algorithm for continuous monitoring of changes in work function using an electron spectrometer

被引:1
作者
Connolly, M [1 ]
Connolly, S [1 ]
McCabe, T [1 ]
Lloyd, DR [1 ]
机构
[1] Univ Dublin Trinity Coll, Dept Chem, Dublin 2, Ireland
关键词
work function; continuous monitoring; electron spectrometer;
D O I
10.1088/0957-0233/10/3/022
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A new method for driving the D/A controlling an electron spectrometer is described. It is shown that this allows the use of the spectrometer for continuously recording changes in work function, with a precision approaching that of a Kelvin probe, and also provides a monitoring method for highly reproducible dosing of a surface to a constant condition.
引用
收藏
页码:246 / 251
页数:6
相关论文
共 19 条
[11]   AC RETARDING POTENTIAL TECHNIQUE FOR CONTINUOUS MEASUREMENT OF CHANGES IN WORK FUNCTION [J].
NATHAN, R ;
HOPKINS, BJ .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (10) :851-854
[12]   KINETIC OSCILLATIONS IN OXIDATION OF CO OVER PT(100) - A STUDY BY RUTHERFORD BACKSCATTERING, NUCLEAR MICROANALYSIS, LEED, AND WORK FUNCTION TECHNIQUES [J].
NORTON, PR ;
BINDNER, PE ;
GRIFFITHS, K ;
JACKMAN, TE ;
DAVIES, JA ;
RUSTIG, J .
JOURNAL OF CHEMICAL PHYSICS, 1984, 80 (08) :3859-3865
[13]   CYANOGEN ADSORPTION ON PD(110) AT LOW-TEMPERATURES - A STUDY WITH ANGLE-RESOLVED PHOTOEMISSION, LEED AND THERMAL-DESORPTION [J].
RAMSEY, MG ;
ROSINA, G ;
NETZER, FP ;
SAALFELD, HB ;
LLOYD, DR .
SURFACE SCIENCE, 1989, 217 (1-2) :140-154
[14]  
ROSSI F, 1998, REV SCI INSTRUM, V69, P4178
[15]   METHOD OF CONTINUOUSLY MEASURING WORK FUNCTION CHANGES [J].
TAYLOR, JL ;
WEINBERG, WH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (06) :1811-1814
[16]  
TURNER DW, 1970, MOL PHOTOELECTRON SP, P3
[17]  
WOODRUFF DP, 1988, MODERN TECHNIQUES SU, P356
[18]   Generation and reaction of vinyl groups on a Cu(100) surface [J].
Yang, MX ;
Eng, J ;
Kash, PW ;
Flynn, GW ;
Bent, BE ;
Holbrook, MT ;
Bare, SR ;
Gland, JL ;
Fischer, DA .
JOURNAL OF PHYSICAL CHEMISTRY, 1996, 100 (30) :12431-12439
[19]   ON THE ANALYSIS OF SECONDARY-ELECTRON EMISSION-SPECTRA [J].
ZIMMER, HG ;
WESTPHAL, D ;
KLEINHERBERS, KK ;
GOLDMANN, A ;
RICHARD, A .
SURFACE SCIENCE, 1984, 146 (2-3) :425-437