Analysis of tip-sample interaction in tapping-mode atomic force microscope using an electrical circuit simulator

被引：11

作者：

Sahin, O ^{[1
]}

Atalar, A ^{[1
]}

机构：

[1] Bilkent Univ, Dept Elect & Elect Engn, TR-06533 Ankara, Turkey

来源：

APPLIED PHYSICS LETTERS | 2001年 / 78卷 / 19期

关键词：

D O I：

10.1063/1.1369614

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present a mechanical model for the atomic force microscope tip tapping on a sample. The model treats the tip as a forced oscillator and the sample as an elastic material with adhesive properties. It is possible to transform the model into an electrical circuit, which offers a way of simulating the problem with an electrical circuit simulator. Also, the model predicts the energy dissipation during the tip-sample interaction. We briefly discuss the model and give some simulation results to promote an understanding of energy dissipation in a tapping mode. (C) 2001 American Institute of Physics.

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收藏

页码：2973 / 2975

页数：3

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