Electric field induced changes in the coercivity of a thin-film ferromagnet

被引：24

作者：

Fowley, C. ^{[1
]}

Rode, K.

Oguz, K.

Kurt, H.

Coey, J. M. D.

机构：

[1] Trinity Coll Dublin, CRANN, Dublin, Ireland

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2011年 / 44卷 / 30期

基金：

爱尔兰科学基金会;

关键词：

MAGNETIC-ANISOTROPY; MAGNETOCRYSTALLINE ANISOTROPY;

D O I：

10.1088/0022-3727/44/30/305001

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Data are presented which indicate a modification of magnetic anisotropy in the MgO/CoFeB/Pd and MgO/CoFeB/Pt systems, using electric fields of order 500 MV m(-1) (0.5 V nm(-1)) applied across a thermally grown SiO2 as a gate dielectric. The effect is most prominent at low temperature (12 K) and is manifested as a small change in coercivity. The sign of the effect depends on the choice of both capping layer and annealing temperature. The results suggest that both interfaces play a role in the appearance of perpendicular magnetic anisotropy in these thin-film stacks, and not just the interface with MgO.

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页数：5

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