Scanning tunneling microscopy observation of graphite surfaces irradiated with size-selected Ar cluster ion beams

被引:29
作者
Houzumi, S
Mochiji, K
Toyoda, N
Yamada, I
机构
[1] Univ Hyogo, Dept Mech & Syst Engn, Himeji, Hyogo 6712201, Japan
[2] Univ Hyogo, Lab Adv Sci & Technol Ind, Ako, Hyogo 6781205, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2005年 / 44卷 / 08期
关键词
cluster ion; cluster size; size selection; scanning tunneling microscopy;
D O I
10.1143/JJAP.44.6252
中图分类号
O59 [应用物理学];
学科分类号
摘要
A cluster ion irradiation system with cluster size selection has been developed to study the effects of the cluster size in surface processing using cluster ions. A permanent magnet with a magnetic field of 1.2T was installed for size separation of large cluster ions. Traces formed on a graphite surface by the impact with Ar cluster ions under an acceleration energy of 30 keV were investigated by, scanning tunneling microscopy. The nature of the traces is strongly affected by the number of constituent atoms of the irradiating cluster ion. When the cluster ion is composed of 100-3000 atoms, crater like traces are observed on the irradiated surfaces. In contrast, such traces are not observed at all with the irradiation of the cluster ions composed of over 5000 atoms. This behavior is discussed on the basis of the kinetic energy per constituent atom of the cluster ion.
引用
收藏
页码:6252 / 6254
页数:3
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