Comparison of dynamic lever STM and noncontact AFM

被引：26

作者：

Guggisberg, M ^{[1
]}

Bammerlin, M ^{[1
]}

Luthi, R ^{[1
]}

Loppacher, C ^{[1
]}

Battiston, F ^{[1
]}

Lu, J ^{[1
]}

Baratoff, A ^{[1
]}

Meyer, E ^{[1
]}

Guntherodt, HJ ^{[1
]}

机构：

[1] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 66卷 / Suppl 1期

关键词：

D O I：

10.1007/s003390051139

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We investigate interaction effects which occur in scanning tunneling microscopy (STM) by performing local force spectroscopy with an oscillating tip while imaging Si(111)7 x 7 terraces in the dynamic lever STM mode (constant time-averaged current). It is found that true atomic resolution is achieved close to the minimum of the resonance frequency vs. distance curve and even closer to the sample. On the other hand true atomic resolution in noncontact AFM (constant frequency shift) is expected several nm away from this minimum, in the range where the frequency shift becomes more negative with decreasing distance.

引用

页码：S245 / S248

页数：4

共 18 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].