High resolution central fringe identification

被引：6

作者：

Lee, JY ^{[1
]}

Su, DC ^{[1
]}

机构：

[1] Natl Chiao Tung Univ, Inst Electroopt Engn, Hsinchu, Taiwan

来源：

OPTICS COMMUNICATIONS | 1998年 / 156卷 / 1-3期

关键词：

central fringe; heterodyne interferometry;

D O I：

10.1016/S0030-4018(98)00430-1

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A high resolution central fringe identification by using the heterodyne interferometry with a tunable laser-diode and a fixed wavelength laser is presented. It can be operated easily and can be used to judge which arm of the Michelson interferometer is longer. The feasibility is demonstrated and it has 0.2 nm resolution. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：1 / 4

页数：4

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