SiGe nanostructures

被引:7
作者
Vescan, L [1 ]
Goryll, M [1 ]
Grimm, K [1 ]
Dieker, C [1 ]
Stoica, T [1 ]
机构
[1] Forschungszentrum Julich, Inst Schicht & Ionentech, D-52425 Julich, Germany
来源
1998 TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMS | 1998年
关键词
D O I
10.1109/SMIC.1998.750173
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
There Is increasing interest in Si-based optoelectronics using Si(1-x)Ge(x) nanostructures due to the possibility of their integration with the Si technology. To overcome the problem of the indirect character of SiGe one is looking for means to increase the transition probability by realizing structures involving quantum-size effects. Several fabrication strategies for semiconductor nanostructures have been proposed. One possible approach involves selective epitaxy to fill-in the small holes in patterned substrates. To realize the lateral confinement below 100nm the patterned substrates are made either by e-beam lithography or by optical lithography. Ln the latter case, the sub-100nm confinement is realized by the development of facets. another approach for nanostructures is based on self-organized growth which leads to island formation in highly lattice-mismatched layers. in the present talk these items will be discussed for SiGe as well as device applications such as light emitting diodes. The growth technique used was low pressure chemical vapor deposition.
引用
收藏
页码:38 / 46
页数:9
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