Distribution and structure of N atoms in multiwalled carbon nanotubes using variable-energy X-ray photoelectron spectroscopy

被引:147
作者
Choi, HC
Park, J [1 ]
Kim, B
机构
[1] Korea Univ, Dept Chem, Jochiwon 339700, South Korea
[2] Korea Adv Inst Sci & Technol, Dept Chem, Taejon 305701, South Korea
关键词
D O I
10.1021/jp0453109
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We investigated the inhomogeneous distribution of concentration and electronic structure of the nitrogen (N) atoms doped in the multiwalled carbon nanotubes (CNTs) by variable-energy X-ray photoelectron spectroscopy (XPS), X-ray absorption near-edge structure, and electron energy-loss spectroscopy. The vertically aligned N-doped CNTs on the substrates were grown via pyrolysis of iron phthalocyanine (FePc), cobalt phthalocyanine (CoPc), and nickel phthalocyanine (NiPc) in the temperature range 750-1000 degrees C. They usually have a bamboo-like structure, and the diameter is in the range of 15-80 nm. As the photon energy of XPS increases from 475 to 1265 eV, the N content increases up to 8 atomic %, indicating a higher N concentration at the inside of nanotubes. We identified three typed N structures: graphite-like, pyridine-like, and molecular N-2. The pyridine-like N structure becomes significant at the inner walls. Molecular N would exist as intercalated forms in the vicinity of hollow inside. The XPS valence band analysis reveals that the pyridine-like N structure induces the metallic behaviors. The CNTs grown using NiPc contain the higher content of pyridine-like structure compared to those grown using FePc and Cope, so they exhibit more metallic properties.
引用
收藏
页码:4333 / 4340
页数:8
相关论文
共 56 条
  • [1] Logic circuits with carbon nanotube transistors
    Bachtold, A
    Hadley, P
    Nakanishi, T
    Dekker, C
    [J]. SCIENCE, 2001, 294 (5545) : 1317 - 1320
  • [2] XPS spectra of thin CNx films prepared by chemical vapor deposition
    Beshkov, G
    Dimitrov, DB
    Georgiev, S
    Juan-Cheng, D
    Petrov, P
    Velchev, N
    Krastev, V
    [J]. DIAMOND AND RELATED MATERIALS, 1999, 8 (2-5) : 591 - 594
  • [3] DETERMINATION OF TIME SCALES FOR CHARGE-TRANSFER SCREENING IN PHYSISORBED MOLECULES
    BJORNEHOLM, O
    NILSSON, A
    SANDELL, A
    HERNNAS, B
    MARTENSSON, N
    [J]. PHYSICAL REVIEW LETTERS, 1992, 68 (12) : 1892 - 1895
  • [4] XPS AND UPS STUDIES OF INTERACTION OF NITROGEN-CONTAINING MOLECULES WITH NICKEL - USE OF BINDING-ENERGY PATTERNS AND RELATIVE INTENSITIES TO DIAGNOSE SURFACE SPECIES
    BRUNDLE, CR
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (01): : 301 - 309
  • [5] Origin of the large N is binding energy in X-ray photoelectron spectra of calcined carbonaceous materials
    Casanovas, J
    Ricart, JM
    Rubio, J
    Illas, F
    JimenezMateos, JM
    [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1996, 118 (34) : 8071 - 8076
  • [6] Valence band electronic structure of carbon nitride from x-ray photoelectron spectroscopy
    Chen, ZY
    Zhao, JP
    Yano, T
    Ooie, T
    [J]. JOURNAL OF APPLIED PHYSICS, 2002, 92 (01) : 281 - 287
  • [7] Investigation of the Li1+xV3O8 electrode-organic electrolyte interface by scanning photoelectron microscopy
    Choi, HC
    Lee, MK
    Shin, HJ
    Kim, SB
    [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2003, 130 (1-3) : 85 - 96
  • [8] Identification of electron donor states in N-doped carbon nanotubes
    Czerw, R
    Terrones, M
    Charlier, JC
    Blase, X
    Foley, B
    Kamalakaran, R
    Grobert, N
    Terrones, H
    Tekleab, D
    Ajayan, PM
    Blau, W
    Rühle, M
    Carroll, DL
    [J]. NANO LETTERS, 2001, 1 (09) : 457 - 460
  • [9] Nitrogen substitution of carbon in graphite: Structure evolution toward molecular forms
    dos Santos, MC
    Alvarez, F
    [J]. PHYSICAL REVIEW B, 1998, 58 (20): : 13918 - 13924
  • [10] High-resolution XAS spectrum of interstitial nitrogen molecules in the surface oxide matrix of TiAlN film
    Esaka, F
    Shimada, H
    Imamura, M
    Matsubayashi, N
    Kikuchi, T
    Furuya, K
    [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1998, 88 : 817 - 820