The study of MCM-41 molecular sieves by energy-filtering TEM

被引：8

作者：

Chao, KJ ^{[1
]}

Wu, CN ^{[1
]}

Chang, AS ^{[1
]}

Hu, SF ^{[1
]}

机构：

[1] Natl Tsing Hua Univ, Dept Chem, Hsinchu 30043, Taiwan

来源：

MICROPOROUS AND MESOPOROUS MATERIALS | 1999年 / 27卷 / 2-3期

关键词：

EFTEM; MCM-41 molecular sieve; Si distribution image; wall thickness;

D O I：

10.1016/S1387-1811(98)00262-5

中图分类号：

O69 [应用化学];

学科分类号：

081704 ;

摘要：

Energy-filtered transmission electron microscopy (EFTEM) was used to examine the distribution of silicon as T-atoms in mesoporous MCM-41 molecular sieves. At nanometer-sized resolution, the Si distribution image derived from electron energy loss spectroscopy (EELS) with Gatan imaging filter (GIF) was found to be ordered and correlated well to the hexagonal array of the one-dimensional channels of MCM-41. In addition, the pore-to-pore distance and the wall thickness of MCM-41 (determined by Si distribution map) are in good agreement with those derived from X-ray diffraction and N-2 adsorption methods. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：287 / 295

页数：9

共 44 条

[31] MCM-41 as-synthesized and calcined materials: Temporal development of X-ray reflection intensity and pore volume [J].