Continuous evolution of the in-plane magnetic anisotropies with thickness in epitaxial Fe films

被引:140
作者
Gester, M [1 ]
Daboo, C [1 ]
Hicken, RJ [1 ]
Gray, SJ [1 ]
Ercole, A [1 ]
Bland, JAC [1 ]
机构
[1] UNIV CAMBRIDGE,CAVENDISH LAB,CAMBRIDGE CB3 OHE,ENGLAND
关键词
D O I
10.1063/1.362788
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have studied the evolution of the magnetic in-plane anisotropy in epitaxial Fe/GaAs films of both (001) and ((1) over bar 10) orientation as a function of the Fe layer thickness using the longitudinal magneto-optic Kerr effect and Brillouin light scattering. Magnetization curves which are recorded in situ during film growth reveal a continuous change of the net anisotropy axes with increasing film thickness. This behavior can be understood to arise from the combination of a uniaxial and a cubic in-plane magnetic anisotropy which are both thickness dependent. Structural analysis of the substrate and Fe film surfaces provides insight into the contribution of atomic steps at the interfaces to the magnetic anisotropy. Changing the degree of crystalline order at the Fe-GaAs interface allows us to conclude that the magnetic anisotropies are determined by atomic scale order. (C) 1996 American Institute of Physics.
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页码:347 / 355
页数:9
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