Sample-angle feedback for diffraction anomalous fine-structure spectroscopy

被引:3
作者
Cross, JO [1 ]
Elam, WT
Harris, VG
Kirkland, JP
Bouldin, CE
Sorensen, LB
机构
[1] USN, Res Lab, Washington, DC 20375 USA
[2] SFA Inc, Landover, MD 20785 USA
[3] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
[4] Univ Washington, Seattle, WA 98195 USA
关键词
diffraction anomalous fine structure; XAFS; anomalous scattering; sample-angle feedback;
D O I
10.1107/S0909049597014313
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Diffraction anomalous fine-structure (DAFS) experiments measure Bragg peak intensities as continuous functions of photon energy near a core-level excitation. Measuring the integrated intensity at each energy makes the experiments prohibitively slow; however, in many cases DAFS can be collected quickly by measuring only the peak intensity at the center of the rocking curve. A piezoelectric-actuator-driven stage has been designed and tested as part of a sample-angle feedback circuit for locking onto the maximum of the rocking curve while the energy is scanned. Although software peak-tracking requires only a simple calculation of diffractometer angles, it is found that the additional hardware feedback dramatically improves the reproducibility of the data.
引用
收藏
页码:911 / 913
页数:3
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