New trends in STEM-based nano-EELS analysis

被引：37

作者：

Colliex, C

机构：

[1] Lab. Phys. Solides Associe au CNRS, Bât. 510, Université Paris-Sud

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1996年 / 45卷 / 01期

关键词：

nanoanalysis; electron energy loss spectroscopy; data analysis; nanostructures;

D O I：

10.1093/oxfordjournals.jmicro.a023411

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Electron energy loss spectroscopy, when coupled to a field emission STEM offers unique perspectives for subnanometer analysis of inhomogeneous specimens, The present contribution points out how the convergence of progress in instrumentation (practical realization of the spectrum-image mode for data acquisition and processing) and in theory (improvement of the understanding of near-edge fine structures) opens the way to the mapping of electronic, bonding, structural and chemical information with a near-atomic spatial resolution as demonstrated with an example involving a complex nanoparticle.

引用

页码：44 / 50

页数：7

共 23 条

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