Band-Offset Driven Efficiency of the Doping of SiGe Core-Shell Nanowires

被引:58
作者
Amato, Michele [1 ,2 ,3 ]
Ossicini, Stefano [2 ,4 ]
Rurali, Riccardo [1 ]
机构
[1] Inst Ciencia Mat Barcelona CSIC, Barcelona 08193, Spain
[2] CNR, Ist Nanosci, Ctr S3, I-41125 Modena, Italy
[3] Univ Modena & Reggio Emilia, Dipartimento Fis, I-41125 Modena, Italy
[4] Univ Modena & Reggio Emilia, Dipartimento Sci & Metodi Ingn, Ctr Interdipartimentale En&Tech, I-42100 Reggio Emilia, Italy
关键词
SiGe nanowires; band offset; electron/hole gas; doping; DFT; nanostructures for photovoltaics; HOLE GAS; N-TYPE; SEGREGATION; PERFORMANCE; ENERGIES; DEFECTS; SINGLE; GROWTH; LOGIC;
D O I
10.1021/nl103621s
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Impurity doping of semiconducting nanowires has been predicted to become increasingly inefficient as the wire diameter is reduced, because impurity states get deeper due to quantum and dielectric confinement. We show that efficient n- and p-type doping can be achieved in SiGe core-shell nanowires as thin as 2 nm, taking advantage of the band offset at the Si/Ge interface. A one-dimensional electron (hole) gas is created at the band-edge and the carrier density is uniquely controlled by the impurity concentration with no need of thermal activation. Additionally, SiGe core-shell nanowires provide naturally the separation between the different types of carriers, electron and holes, and are ideally suited for photovoltaic applications.
引用
收藏
页码:594 / 598
页数:5
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