The accuracy of quantitative image matching for HRTEM applications

被引:14
作者
Kauffmann, Y [1 ]
Recnik, A
Kaplan, WD
机构
[1] Technion Israel Inst Technol, Dept Mat Engn, IL-32100 Haifa, Israel
[2] Jozef Stefan Inst, Ljubljana, Slovenia
关键词
image matching; quantitative HRTEM; filtering;
D O I
10.1016/j.matchar.2004.11.012
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The accuracy of atomistic model refinement in quantitative high resolution transmission electron microscopy was analyzed using simulated images of aluminum, calculated from crystalline atomistic models and including a thin coating of amorphous aluminum. The images, which contained a realistic background 'noise' resulting from the amorphous aluminum layers, were processed using two filtering methods, and then compared to images simulated from models without the amorphous layer. The effects of filtering were assessed by quantitatively matching the processed images with those from a perfect structure, and a method to select optimized matching criteria for comparing simulated and experimental images was developed. Errors introduced by filtering noise are converted into accuracy of atomic column determination. (c) 2004 Elsevier Inc. All rights reserved.
引用
收藏
页码:194 / 205
页数:12
相关论文
共 25 条
[1]   IMAGE-PROCESSING OF HRTEM IMAGES WITH NON-PERIODIC FEATURES [J].
DEJONG, AF ;
COENE, W ;
VANDYCK, D .
ULTRAMICROSCOPY, 1989, 27 (01) :53-66
[2]   Distance-based functions for image comparison [J].
Di Gesù, V ;
Starovoitov, V .
PATTERN RECOGNITION LETTERS, 1999, 20 (02) :207-214
[3]   INTERATOMIC POTENTIALS FROM 1ST-PRINCIPLES CALCULATIONS - THE FORCE-MATCHING METHOD [J].
ERCOLESSI, F ;
ADAMS, JB .
EUROPHYSICS LETTERS, 1994, 26 (08) :583-588
[4]   Present developments in high-resolution transmission electron microscopy [J].
Ernst, F ;
Ruhle, M .
CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 1997, 2 (04) :469-476
[5]   THE SIMULATION OF HIGH-RESOLUTION IMAGES OF AMORPHOUS THIN-FILMS [J].
FAN, GY ;
COWLEY, JM .
ULTRAMICROSCOPY, 1987, 21 (02) :125-130
[6]   EXPERIMENTAL IMAGE-PROCESSING OF SMALL SUPPORTED METALLIC PARTICLES (1-3 NM) [J].
GIORGIO, S ;
NIHOUL, G ;
CHAPON, C ;
HENRY, CR .
MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1991, 2 (06) :627-636
[7]   Ordering at solid-liquid interfaces between dissimilar materials [J].
Hashibon, A ;
Adler, J ;
Finnis, MW ;
Kaplan, WD .
INTERFACE SCIENCE, 2001, 9 (3-4) :175-181
[8]   Atomistic study of structural correlations at a liquid-solid interface [J].
Hashibon, A ;
Adler, J ;
Finnis, MW ;
Kaplan, WD .
COMPUTATIONAL MATERIALS SCIENCE, 2002, 24 (04) :443-452
[9]  
KIENZEL O, 1997, MICROSC MICROANAL M, V190, P144
[10]  
Kilaas R., 1994, Journal of Computer-Assisted Microscopy, V6, P129