共 56 条
[43]
*SEM IND ASS, 1997, NAT TECHN ROADM SEM
[44]
Semiconductor Industry Association, 1999, INT TECHN ROADM SEM
[45]
STATISTICS OF THE CHARGE DISTRIBUTION FOR A LOCALIZED FLAW IN A SEMICONDUCTOR
[J].
PHYSICAL REVIEW,
1957, 107 (02)
:392-396
[47]
TAKAGI S, 1999, P INT EL DEV M DEC, P461
[48]
25 nm CMOS design considerations
[J].
INTERNATIONAL ELECTRON DEVICES MEETING 1998 - TECHNICAL DIGEST,
1998,
:789-792
[49]
Thompson S, 1998, VLSI S, P132
[50]
THOMPSON ST, COMMUNICATION