Determination of strain-induced valence-band splitting in GaAsN thin films from circularly polarized photoluminescence

被引:25
作者
Egorov, AY
Kalevich, VK
Afanasiev, MM
Shiryaev, AY
Ustinov, VM
Ikezawa, M
Masumoto, Y
机构
[1] AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia
[2] Univ Tsukuba, Inst Phys, Tsukuba, Ibaraki 3058571, Japan
基金
俄罗斯基础研究基金会;
关键词
D O I
10.1063/1.1949718
中图分类号
O59 [应用物理学];
学科分类号
摘要
The paper studies the circularly polarized photoluminescence (PL) from dilute GaAsN alloys with nitrogen content of 1%-3.4%, grown on GaAs substrates. The room-temperature PL is found to consist of two bands whose splitting grows with increasing nitrogen content. The analysis of the PL circular polarization has shown that the PL bands originate from the splitting of light- and heavy-hole subbands, induced by an elastic strain in GaAsN layer. The dependence of the energy gap of unstrained GaAsN on the nitrogen content has been calculated using the measured light- and heavy-hole splittings. (c) 2005 American Institute of Physics.
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页数:6
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