Growth of praseodymium oxide thin films by liquid injection MOCVD using a novel praseodymium alkoxide precursor

被引:28
作者
Aspinall, HC
Gaskell, J
Williams, PA
Jones, AC [1 ]
Chalker, PR
Marshall, PA
Bickley, JF
Smith, LM
Critchlow, GW
机构
[1] Univ Liverpool, Dept Chem, Liverpool L69 3ZD, Merseyside, England
[2] Univ Liverpool, Dept Mat Sci & Engn, Liverpool L69 3BX, Merseyside, England
[3] Epichem Oxides & Nitrides, Wirral CH62 3QF, Merseyside, England
[4] Univ Loughborough, Inst Surface Sci & Technol, Loughborough LE11 3TU, Leics, England
关键词
D O I
10.1002/cvde.200304160
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Communication: Praseodymium oxide thin films are prepared using a new volatile precursor (for structure of precursor LiCl complex, see Figure) by liquid injection MOCVD. The oxide, a wide-bandgap (3.9 eV) and high-K material. which is currently being investigated as a possible alternative to SiO2 films in silicon-based field-effect transistors, is deposited from [Pr(MMP)(3)] (mmp = OCMe2CH2OMe) in the presence of oxygen over the temperature ranae 350-600 degreesC.
引用
收藏
页码:235 / +
页数:5
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