共 12 条
[2]
HANSZEN KJ, 1965, Z ANGEW PHYSIK, V19, P215
[3]
IKUTA T, 1989, J ELECTRON MICROSC, V38, P415
[4]
Influence of anti-symmetric wave aberrations and the simple correction filter in the Fourier space
[J].
JOURNAL OF ELECTRON MICROSCOPY,
1999, 48 (04)
:417-429
[5]
Development of a real-time defocus image modulation processing electron microscope. I. Construction
[J].
JOURNAL OF ELECTRON MICROSCOPY,
1999, 48 (06)
:873-878
[8]
Development of a real-time defocus-image modulation processing electron microscope. II. Dynamic observation of spherical aberration-free phase image of surface atoms
[J].
JOURNAL OF ELECTRON MICROSCOPY,
1999, 48 (06)
:879-885
[9]
TANIGUCHI Y, 1990, J ELECTRON MICROSC, V39, P137
[10]
TANIGUCHI Y, 1991, J ELECTRON MICROSC, V40, P5