Photoablation and microstructuring of polyestercarbonates and their blends with a XeCl excimer laser

被引:24
作者
Kunz, T
Stebani, J
Ihlemann, J
Wokaun, A [1 ]
机构
[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland
[2] Bayer AG, Werk Leverkusen, D-51368 Leverkusen, Germany
[3] Laser Lab Gottingen EV, D-37077 Gottingen, Germany
[4] ETH Zentrum, Dept Chem Engn & Ind Chem, CH-8092 Zurich, Switzerland
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 67卷 / 03期
关键词
D O I
10.1007/s003390050782
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The growing held of microtechnology creates a need for new methods of structuring affordable materials. Excimer ablation lithography (EAL) has been introduced as a new method for producing microstructures. The ablation and microstructuring behavior of bis-phenol-polycarbonate-A, several polyestercarbonates and their blends in varying proportions, were investigated by using the radiation of a XeCl excimer laser. It was found that a minimum content of polyester, either in the co-condensate or in the blend, is necessary to obtain transparent structures in the irradiated film for irradiation at 308 nm. When recorded as a function of the molar fraction of the polyester, the etch rate passes through a local maximum and consecutively decreases with increasing content of the polyester group in the polymer bulk. Microstructures with a resolution in the sub-micron scale were obtained by EAL, and the resultant structures were made visible and analyzed using an atomic force microscope (AFM).
引用
收藏
页码:347 / 352
页数:6
相关论文
共 19 条
[1]  
CAIN S, 1992, J APPL PHYS, V71, P4105
[2]   A PHOTOTHERMAL MODEL FOR POLYMER ABLATION - CHEMICAL MODIFICATION [J].
CAIN, SR .
JOURNAL OF PHYSICAL CHEMISTRY, 1993, 97 (29) :7572-7577
[3]   EXCIMER-LASER ABLATION OF POLYIMIDE-DOPED POLY(TETRAFLUOROETHYLENE) AT 248 AND 308 NM [J].
DCOUTO, GC ;
BABU, SV ;
EGITTO, FD ;
DAVIS, CR .
JOURNAL OF APPLIED PHYSICS, 1993, 74 (10) :5972-5980
[4]   TEMPERATURE-MEASUREMENTS OF THE GASEOUS EMISSION DURING THE FRACTURE OF POLYSTYRENE - A DETERMINATION OF THE FRACTURE ENERGY AND FRACTURE SURFACE-TEMPERATURE [J].
DICKINSON, JT ;
JENSEN, LC ;
LANGFORD, SC ;
DION, RP .
JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS, 1994, 32 (04) :779-784
[5]   DOPANT-INDUCED EXCIMER LASER ABLATION OF POLY(TETRAFLUOROETHYLENE) .2. EFFECT OF DOPANT CONCENTRATION [J].
EGITTO, FD ;
DAVIS, CR .
APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY, 1992, 55 (06) :488-493
[6]   FABRICATION OF CONTINUOUS-RELIEF MICRO-OPTICAL ELEMENTS BY DIRECT LASER WRITING IN PHOTORESISTS [J].
GALE, MT ;
ROSSI, M ;
PEDERSEN, J ;
SCHUTZ, H .
OPTICAL ENGINEERING, 1994, 33 (11) :3556-3566
[7]   EXCIMER-LASER ABLATION PATTERNING OF DIELECTRIC LAYERS [J].
IHLEMANN, J ;
WOLFFROTTKE, B .
APPLIED SURFACE SCIENCE, 1995, 86 (1-4) :228-233
[8]   FEMTOSECOND UV EXCIMER LASER ABLATION [J].
KUPER, S ;
STUKE, M .
APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY, 1987, 44 (04) :199-204
[9]   UV-EXCIMER-LASER ABLATION OF POLYMETHYLMETHACRYLATE AT 248 NM - CHARACTERIZATION OF INCUBATION SITES WITH FOURIER-TRANSFORM IR-SPECTROSCOPY AND UV-SPECTROSCOPY [J].
KUPER, S ;
STUKE, M .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1989, 49 (02) :211-215
[10]   TRIAZENE POLYMERS DESIGNED FOR EXCIMER LASER ABLATION [J].
LIPPERT, T ;
WOKAUN, A ;
STEBANI, J ;
NUYKEN, O ;
IHLEMANN, J .
ANGEWANDTE MAKROMOLEKULARE CHEMIE, 1993, 206 :97-110