Recent trends in single-event effect ground testing

被引:24
作者
Duzellier, S [1 ]
Ecoffet, R [1 ]
机构
[1] CNES,F-31055 TOULOUSE,FRANCE
关键词
D O I
10.1109/23.490910
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Single-event phenomena result from a single particle, heavy ion or proton, inducing transients in the sensitive volume of integrated circuits. Particle accelerators are used to simulate the space environment in order to perform a full characterization of the components. This paper describes the methods and facilities necessary for single-event effect (SEE) testing as well as recent trends observed in the device response to radiation.
引用
收藏
页码:671 / 677
页数:7
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