Oxygen tracer diffusion in polycrystalline In2O3

The oxygen tracer diffusion coefficient in high-purity polycrystalline In2O3 was determined using O-18 as a tracer. The specimen was prepared by annealing In2O3 powder at 1400 degrees C. The diffusion process was monitor-ed by reaction gas analysis or by the microbalance method. Within the range of 800 to 1100 degrees C, the oxygen-tracer diffusion coefficient (D*) was calculated to be D* = 5.24 x 10(7) exp [-491 kJ mol(-1)/RT] cm(2) s(-1). This is smaller than the value reported in the literature for Zr-In2O3. The smaller value is thought to be due to the lack of an oxygen concentration gradient in the present study.