A comparison of atomic force microscope friction and phase imaging for the characterization of an immiscible polystyrene/poly(methyl methacrylate) blend film

被引:23
作者
Paige, MF [1 ]
机构
[1] Univ Saskatchewan, Dept Chem, Saskatoon, SK S7N 5C9, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
atomic force microscope; polymer film; compositional mapping;
D O I
10.1016/S0032-3861(03)00611-6
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Three different forms of atomic force microscope (AFM) measurement, topography, friction force and phase imaging, have been used to investigate the surface morphology and local composition of an immiscible polystyrene (PS)/poly(methyl methacrylate) (PMMA) blend film. This sample forms discrete, micron-size domains in a continuous matrix, which is attributed to the segregation of PMMA in PS. When the samples were imaged in air, contrast in friction and phase images was caused by variations in sample topography only. When the samples were imaged under water, however, both friction and phase imaging yielded non-topographic contrast between domains. We ascribe the contrast in both of these imaging modes to preferential softening of the hydrophilic, PMMA-rich domains and to stronger tip-sample adhesive forces, highlighting the AFM's utility for probing local elastic properties and for compositional mapping of soft polymer samples. (C) 2003 Elsevier Ltd. All rights reserved.
引用
收藏
页码:6345 / 6352
页数:8
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