Phase segregation in polymer thin films: Elucidations by X-ray and scanning force microscopy

被引:61
作者
Ade, H [1 ]
Winesett, DA
Smith, AP
Qu, S
Ge, S
Sokolov, J
Rafailovich, M
机构
[1] N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA
[2] N Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA
[3] SUNY Stony Brook, Dept Mat Sci & Engn, Stony Brook, NY 11794 USA
来源
EUROPHYSICS LETTERS | 1999年 / 45卷 / 04期
关键词
D O I
10.1209/epl/i1999-00198-7
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We have used quantitative X-ray microscopy in combination with Scanning Force Microscopy to monitor the phase separation of spun cast thin films of polystyrene and poly(methyl methacrylate) blends upon annealing. Both techniques complement and enhance each other in elucidating the complicated structures that develop as a function of annealing time. We have determined the composition of the mixed phases that result from solvent spin casting. We subsequently observe the sudden rearrangement into domains much smaller than those originally formed. Unique, intricate hydrodynamic mass flow patterns form during coarsening which are in qualitative agreement with recent simulations of phase segregation in two-dimensional viscous fluids. Complicated polymer-polymer interfaces persist even in the later stages that are explained in terms of the geometric constraints of a thin film and the dependance of polymer viscosity on film thickness.
引用
收藏
页码:526 / 532
页数:7
相关论文
共 19 条
  • [1] CHEMICAL CONTRAST IN X-RAY MICROSCOPY AND SPATIALLY RESOLVED XANES SPECTROSCOPY OF ORGANIC SPECIMENS
    ADE, H
    ZHANG, X
    CAMERON, S
    COSTELLO, C
    KIRZ, J
    WILLIAMS, S
    [J]. SCIENCE, 1992, 258 (5084) : 972 - 975
  • [2] INTERFACIAL-TENSION OF IMMISCIBLE POLYMER BLENDS - TEMPERATURE AND MOLECULAR-WEIGHT DEPENDENCE
    ANASTASIADIS, SH
    GANCARZ, I
    KOBERSTEIN, JT
    [J]. MACROMOLECULES, 1988, 21 (10) : 2980 - 2987
  • [3] Wetting of substrates with phase-separated binary polymer mixtures
    Genzer, J
    Kramer, EJ
    [J]. PHYSICAL REVIEW LETTERS, 1997, 78 (26) : 4946 - 4949
  • [4] X-RAY INTERACTIONS - PHOTOABSORPTION, SCATTERING, TRANSMISSION, AND REFLECTION AT E=50-30,000 EV, Z=1-92
    HENKE, BL
    GULLIKSON, EM
    DAVIS, JC
    [J]. ATOMIC DATA AND NUCLEAR DATA TABLES, 1993, 54 (02) : 181 - 342
  • [5] DIFFRACTION-LIMITED IMAGING IN A SCANNING-TRANSMISSION X-RAY MICROSCOPE
    JACOBSEN, C
    WILLIAMS, S
    ANDERSON, E
    BROWNE, MT
    BUCKLEY, CJ
    KERN, D
    KIRZ, J
    RIVERS, M
    ZHANG, X
    [J]. OPTICS COMMUNICATIONS, 1991, 86 (3-4) : 351 - 364
  • [6] Phase-separation-induced surface patterns in thin polymer blend films
    Karim, A
    Slawecki, TM
    Kumar, SK
    Douglas, JF
    Satija, SK
    Han, CC
    Russell, TP
    Liu, Y
    Overney, R
    Sokolov, O
    Rafailovich, MH
    [J]. MACROMOLECULES, 1998, 31 (03) : 857 - 862
  • [7] SELF-ASSEMBLY OF A HOMOPOLYMER MIXTURE VIA PHASE-SEPARATION
    KRAUSCH, G
    KRAMER, EJ
    RAFAILOVICH, MH
    SOKOLOV, J
    [J]. APPLIED PHYSICS LETTERS, 1994, 64 (20) : 2655 - 2657
  • [8] Direct imaging of surface and bulk structures in solvent cast polymer blend films
    Kumacheva, E
    Li, L
    Winnik, MA
    Shinozaki, DM
    Cheng, PC
    [J]. LANGMUIR, 1997, 13 (09) : 2483 - 2489
  • [9] Polymer thin films on patterned Si surfaces
    Li, Z
    Tolan, M
    Hohr, T
    Kharas, D
    Qu, S
    Sokolov, J
    Rafailovich, MH
    Lorenz, H
    Kotthaus, JP
    Wang, J
    Sinha, SK
    Gibaud, A
    [J]. MACROMOLECULES, 1998, 31 (06) : 1915 - 1920
  • [10] MARK JE, 1996, PHYSICAL POLYM HDB