Chemical force microscopy

被引:436
作者
Noy, A [1 ]
Vezenov, DV [1 ]
Lieber, CM [1 ]
机构
[1] HARVARD UNIV, DIV ENGN & APPL SCI, CAMBRIDGE, MA 02138 USA
来源
ANNUAL REVIEW OF MATERIALS SCIENCE | 1997年 / 27卷
关键词
atomic force microscopy; friction; adhesion; self-assembled monolayers; surface free energy; force titration; double layer; imaging;
D O I
10.1146/annurev.matsci.27.1.381
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Atomic force microscopy is an imaging tool used widely in fundamental research, although it has, like other scanned probe microscopies, provided only limited information about the chemical nature of systems studied. Modification of force microscope probe tips by covalent linking of organic monolayers that terminate in well-defined functional groups enables direct probing of molecular interactions and imaging with chemical sensitivity. This new chemical force microscopy technique has been used to probe adhesion and frictional forces between distinct chemical groups in organic and aqueous solvents. Contact mechanics provide a framework to model the adhesive forces and to estimate the number of interacting molecular groups. In general, measured adhesive and frictional forces follow trends expected from the strengths of the molecular interactions, although solvation also plays an important role. Knowledge of these forces provides a basis for rationally interpretable mapping of a variety of chemical functionalities and processes such as protonation and ionization.
引用
收藏
页码:381 / 421
页数:41
相关论文
共 146 条
  • [1] CHEMICAL IMAGING BY SCANNING FORCE MICROSCOPY
    AKARI, S
    HORN, D
    KELLER, H
    SCHREPP, W
    [J]. ADVANCED MATERIALS, 1995, 7 (06) : 549 - 551
  • [2] Imaging of single polyethylenimine polymers adsorbed on negatively charged latex spheres by chemical force microscopy
    Akari, S
    Schrepp, W
    Horn, D
    [J]. LANGMUIR, 1996, 12 (04) : 857 - 860
  • [3] MICROFABRICATION OF CANTILEVER STYLI FOR THE ATOMIC FORCE MICROSCOPE
    ALBRECHT, TR
    AKAMINE, S
    CARVER, TE
    QUATE, CF
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04): : 3386 - 3396
  • [4] SELF-ASSEMBLED MONOLAYER FILM FOR ENHANCED IMAGING OF ROUGH SURFACES WITH ATOMIC-FORCE MICROSCOPY
    ALLEY, RL
    KOMVOPOULOS, K
    HOWE, RT
    [J]. JOURNAL OF APPLIED PHYSICS, 1994, 76 (10) : 5731 - 5737
  • [5] Analysis of surface forces on oxides in aqueous solutions using AFM
    Arai, T
    Aoki, D
    Okabe, Y
    Fujihira, M
    [J]. THIN SOLID FILMS, 1996, 273 (1-2) : 322 - 326
  • [6] OBSERVATION OF A SINGLE-BEAM GRADIENT FORCE OPTICAL TRAP FOR DIELECTRIC PARTICLES
    ASHKIN, A
    DZIEDZIC, JM
    BJORKHOLM, JE
    CHU, S
    [J]. OPTICS LETTERS, 1986, 11 (05) : 288 - 290
  • [7] DIRECT IMAGING OF THE TIP SHAPE BY AFM
    ATAMNY, F
    BAIKER, A
    [J]. SURFACE SCIENCE, 1995, 323 (03) : L314 - L318
  • [8] FORMATION OF MONOLAYERS BY THE COADSORPTION OF THIOLS ON GOLD - VARIATION IN THE HEAD GROUP, TAIL GROUP, AND SOLVENT
    BAIN, CD
    EVALL, J
    WHITESIDES, GM
    [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1989, 111 (18) : 7155 - 7164
  • [9] FORMATION OF MONOLAYER FILMS BY THE SPONTANEOUS ASSEMBLY OF ORGANIC THIOLS FROM SOLUTION ONTO GOLD
    BAIN, CD
    TROUGHTON, EB
    TAO, YT
    EVALL, J
    WHITESIDES, GM
    NUZZO, RG
    [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1989, 111 (01) : 321 - 335
  • [10] FUNCTIONAL-GROUP IMAGING BY ADHESION AFM APPLIED TO LIPID MONOLAYERS
    BERGER, CEH
    VANDERWERF, KO
    KOOYMAN, RPH
    DEGROOTH, BG
    GREVE, J
    [J]. LANGMUIR, 1995, 11 (11) : 4188 - 4192