DIRECT IMAGING OF THE TIP SHAPE BY AFM

被引:51
作者
ATAMNY, F [1 ]
BAIKER, A [1 ]
机构
[1] ETH ZENTRUM,DEPT CHEM ENGN & IND CHEM,CH-8092 ZURICH,SWITZERLAND
关键词
ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; COPPER; SCANNING ELECTRON MICROSCOPY (SEM); SILICON NITRIDE; SURFACE STRUCTURE; MORPHOLOGY; ROUGHNESS AND TOPOGRAPHY;
D O I
10.1016/0039-6028(94)00752-7
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Direct imaging of the tip shape by AFM has been achieved using sharp pin-like structures present on copper films deposited on quartz by metal organic chemical vapor deposition (MOCVD).
引用
收藏
页码:L314 / L318
页数:5
相关论文
共 24 条
  • [1] BECHT M, UNPUB FRESENIUS J AN
  • [2] BECHT M, COMMUNICATION
  • [3] ION MILLED TIPS FOR SCANNING TUNNELING MICROSCOPY
    BIEGELSEN, DK
    PONCE, FA
    TRAMONTANA, JC
    KOCH, SM
    [J]. APPLIED PHYSICS LETTERS, 1987, 50 (11) : 696 - 698
  • [4] ATOMIC FORCE MICROSCOPE
    BINNIG, G
    QUATE, CF
    GERBER, C
    [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
  • [5] TEXTURED TIN OXIDE-FILMS PRODUCED BY ATMOSPHERIC-PRESSURE CHEMICAL VAPOR-DEPOSITION FROM TETRAMETHYLTIN AND THEIR USEFULNESS IN PRODUCING LIGHT TRAPPING IN THIN-FILM AMORPHOUS-SILICON SOLAR-CELLS
    GORDON, RG
    PROSCIA, J
    ELLIS, FB
    DELAHOY, AE
    [J]. SOLAR ENERGY MATERIALS, 1989, 18 (05): : 263 - 281
  • [6] VANDERWAALS INTERACTIONS BETWEEN SHARP PROBES AND FLAT SAMPLE SURFACES
    HARTMANN, U
    [J]. PHYSICAL REVIEW B, 1991, 43 (03): : 2404 - 2407
  • [7] CAN ATOMIC FORCE MICROSCOPY TIPS BE INSPECTED BY ATOMIC FORCE MICROSCOPY
    HELLEMANS, L
    WAEYAERT, K
    HENNAU, F
    STOCKMAN, L
    HEYVAERT, I
    VANHAESENDONCK, C
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 1309 - 1312
  • [8] Z CALIBRATION OF THE ATOMIC-FORCE MICROSCOPE BY MEANS OF A PYRAMIDAL TIP
    JENSEN, F
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (09) : 2595 - 2597
  • [9] KELLER D, 1991, SURF SCI, V353, P253
  • [10] ROLE OF TIP STRUCTURE IN SCANNING TUNNELING MICROSCOPY
    KUK, Y
    SILVERMAN, PJ
    [J]. APPLIED PHYSICS LETTERS, 1986, 48 (23) : 1597 - 1599