Cryogenic scanning tunneling microscope for quantum dot spectroscopy

被引:9
作者
Chang, TH
Yang, CH [1 ]
Yang, MJ
Dottellis, JB
机构
[1] Univ Maryland, Dept Elect & Comp Engn, College Pk, MD 20742 USA
[2] USN, Res Lab, Washington, DC 20375 USA
[3] Lab Phys Sci, College Pk, MD 20740 USA
关键词
D O I
10.1063/1.1379608
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We have designed and fabricated a cryogenic scanning tunneling microscope for probing lithography defined nanometer-scale devices. The piezoelectric double tube is capable of scanning an area up to 22 mu mx22 mum, while maintaining atomic resolution. In addition, the sample mount has a 5 mmx4 mm traveling range. Most importantly, the system is compact and, as a result, it can be inserted into the bore of a superconducting magnet. In this work, we demonstrate a unique application of scanning tunneling system, i.e., the scanning tip is in direct contact with the sample. The spectroscopic information therefore reflects the true characteristics of the devices under test, unlike the typical case where the tunneling barrier through vacuum imposes a large series resistance, on the order of 10(9) Omega. The design as well as the operation of this compact scanning tunneling microscope is described. (C) 2001 American Institute of Physics.
引用
收藏
页码:2989 / 2995
页数:7
相关论文
共 66 条
[1]   COMPARISON OF VARIOUS LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPY DESIGNS FOR USE IN SPECTROSCOPY AND TOPOGRAPHY [J].
ADLER, JG ;
CHEN, TT ;
GALLAGHER, MC ;
KONKIN, MK ;
MULLIN, DP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02) :992-995
[2]   VERTICAL INERTIAL PIEZOELECTRIC TRANSLATION DEVICE FOR A SCANNING TUNNELING MICROSCOPE [J].
AGRAIT, N .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01) :263-264
[3]   SIMPLE MICROPOSITIONING DEVICES FOR STM [J].
ANDERS, M ;
THAER, M ;
HEIDEN, C .
SURFACE SCIENCE, 1987, 181 (1-2) :176-182
[4]   SINGLE-ELECTRON CAPACITANCE SPECTROSCOPY OF DISCRETE QUANTUM LEVELS [J].
ASHOORI, RC ;
STORMER, HL ;
WEINER, JS ;
PFEIFFER, LN ;
PEARTON, SJ ;
BALDWIN, KW ;
WEST, KW .
PHYSICAL REVIEW LETTERS, 1992, 68 (20) :3088-3091
[5]   Applications with a new low-temperature UHV STM at 5 K [J].
Backer, T ;
Hovel, H ;
Tschudy, M ;
Reihl, B .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1) :S27-S30
[6]   Identification of atomic-like electronic states in indium arsenide nanocrystal quantum dots [J].
Banin, U ;
Cao, YW ;
Katz, D ;
Millo, O .
NATURE, 1999, 400 (6744) :542-544
[7]   LOW-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY STUDIES OF GRANULAR METAL-FILMS [J].
BARSADEH, E ;
GOLDSTEIN, Y ;
WOLOVELSKY, M ;
PORATH, D ;
ZHANG, C ;
DENG, H ;
ABELES, B ;
MILLO, O .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (03) :1084-1088
[8]   CHARACTERIZATION OF VERY NARROW QUASI-ONE-DIMENSIONAL QUANTUM CHANNELS [J].
BERGGREN, KF ;
ROOS, G ;
VANHOUTEN, H .
PHYSICAL REVIEW B, 1988, 37 (17) :10118-10124
[9]   AN EASILY OPERABLE SCANNING TUNNELING MICROSCOPE [J].
BESOCKE, K .
SURFACE SCIENCE, 1987, 181 (1-2) :145-153
[10]   7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J].
BINNIG, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1983, 50 (02) :120-123