Picosecond free-electron laser studies of Auger recombination in arsenic-rich InAs1-xSbx strained layer superlattices at 300K

被引:3
作者
Ciesla, CM [1 ]
Murdin, BN
Pidgeon, CR
Stradling, RA
Phillips, CC
Bain, DJ
Galbraith, I
Jaroszynski, DA
Langerak, CJGM
Tang, PJP
Pullin, MJ
机构
[1] Heriot Watt Univ, Dept Phys, Edinburgh EH14 4AS, Midlothian, Scotland
[2] FOM, Inst Plasma Phys, NL-3430 BE Nieuwegein, Netherlands
[3] Univ London Imperial Coll Sci Technol & Med, Dept Phys, London SW7 2AZ, England
[4] Univ Paris Sud, LURE, F-91405 Orsay, France
来源
IEE PROCEEDINGS-OPTOELECTRONICS | 1997年 / 144卷 / 05期
关键词
free electron lasers; strained layer superlattices;
D O I
10.1049/ip-opt:19971593
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Room temperature pump-probe transmission experiments have been performed on arsenic-rich InAs/lnAs(1-x)Sb(x) strained layer superlattices (SLS) using a picosecond far-infrared free electron laser,With excitation frequencies well above the fundamental bandgap, near 10 mu m, large excited carrier concentrations were obtained, allowing the density dependence of the recombination rate to be determined directly. The results have been interpreted in terms of an 8x8 k.p SLS energy band calculation, including the full dispersion for both k in-plane and k parallel to the growth direction. A comparison with identical measurements on epilayers of InSb, of comparable room temperature bandgap, shows that the Auger processes have been substantially suppressed in the superlattices. In the non-degenerate regime, where the Auger lifetime scales as tau(aug)(-1) = C1Ne2, a value of C-1 between 10 and 100 times smaller is obtained for the SLS structures.
引用
收藏
页码:331 / 335
页数:5
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