Conducting probe atomic force microscopy applied to organic conducting blends

被引：38

作者：

Planès, J

Houzé, F

Chrétien, P

Schneegans, O

机构：

[1] Univ Grenoble 1, CEA, DRFMC, S13M,CNRS,Lab Phys Met Synthet, F-38054 Grenoble 9, France

[2] Univ Paris 06, Univ Paris Sud, CNRS, Supelee,UMR 8507,Lab Genie Elect Paris, F-91192 Gif Sur Yvette, France

来源：

APPLIED PHYSICS LETTERS | 2001年 / 79卷 / 18期

关键词：

D O I：

10.1063/1.1413717

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Atomic force microscopy (AFM) is used in contact mode with a conducting tip to probe the conducting network of the conductive polymer polyaniline blended in an insulating polymer matrix. The high resistance contrast and sharp boundaries between conductive and insulating phases is observed down to scales in the 10 nm range. The very low scale electric dispersion corresponds to the morphologic phase segregation known from conventional AFM or transmission electron microscopy measurements, which is responsible for the ultralow electrical percolation threshold previously demonstrated in this system. (C) 2001 American Institute of Physics.

引用

页码：2993 / 2995

页数：3

共 19 条

[11] Gate voltage dependent resistance of a single organic semiconductor grain boundary [J].

Kelley, TW ;

Frisbie, CD .

JOURNAL OF PHYSICAL CHEMISTRY B, 2001, 105 (20) :4538-4540

[12]

Kelley TW, 1999, ADV MATER, V11, P261, DOI 10.1002/(SICI)1521-4095(199903)11:3<261::AID-ADMA261>3.0.CO

[13]

2-B

[14] Probing electron conduction at the microscopic level in percolating nanocomposites by conducting atomic-force microscopy [J].

Luo, EZ ;

Wilson, IH ;

Yan, X ;

Xu, JB .

PHYSICAL REVIEW B, 1998, 57 (24) :15120-15123

[15] Atomic force microscopy phase imaging of conductive polymer blends with ultralow percolation threshold [J].

Planès, J ;

Samson, Y ;

Cheguettine, Y .

APPLIED PHYSICS LETTERS, 1999, 75 (10) :1395-1397

[16] Mesostructure of polymer/carbon black composites observed by conductive probe atomic force microscopy [J].

Ravier, J ;

Houzé, F ;

Carmona, F ;

Schneegans, O ;

Saadaoui, H .

CARBON, 2001, 39 (02) :314-318

[17] Potentiometry of an operating organic semiconductor field-effect transistor [J].

Seshadri, K ;

Frisbie, CD .

APPLIED PHYSICS LETTERS, 2001, 78 (07) :993-995

[18] DIRECT IMAGING OF THE PERCOLATION NETWORK IN A 3-DIMENSIONAL DISORDERED CONDUCTOR-INSULATOR COMPOSITE [J].

VISWANATHAN, R ;

HEANEY, MB .

PHYSICAL REVIEW LETTERS, 1995, 75 (24) :4433-4436

[19] MORPHOLOGY OF CONDUCTIVE, SOLUTION-PROCESSED BLENDS OF POLYANILINE AND POLY(METHYL METHACRYLATE) [J].

YANG, CY ;

CAO, Y ;

SMITH, P ;

HEEGER, AJ .

SYNTHETIC METALS, 1993, 53 (03) :293-301

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