Focusing X-ray beams to nanometer dimensions

被引：126

作者：

Bergemann, C

Keymeulen, H

van der Veen, JF

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[2] Swiss Fed Inst Technol, Zurich, Switzerland

[3] ETH Honggerberg, Festkorperphys Lab, CH-8093 Zurich, Switzerland

来源：

PHYSICAL REVIEW LETTERS | 2003年 / 91卷 / 20期

关键词：

D O I：

10.1103/PhysRevLett.91.204801

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We address the question: what is the smallest spot size to which an x-ray beam can be focused? We show that confinement of the beam within a narrowly tapered waveguide leads to a theoretical minimum beam size of the order of 10 nm (FWHM), the exact value depending only on the electron density of the confining material. This limit appears to apply to all x-ray focusing devices. Mode mixing and interference can help to achieve this spot size without the need for ultrasmall apertures.

引用

页数：4

共 15 条

[1]

ALSNIELSEN J, 2001, ELEMENTS MODERN XRAY, P63

[2]

[Anonymous], 1964, Handbook of mathematical functions

[3] NANOMETER SPATIAL-RESOLUTION ACHIEVED IN HARD X-RAY-IMAGING AND LAUE DIFFRACTION EXPERIMENTS [J].