Correlations of Capacitance-Voltage Hysteresis with Thin-film CdTe Solar Cell Performance During Accelerated Lifetime Testing

被引：5

作者：

Albin, David S. ^{[1
]}

del Cueto, Joseph A. ^{[1
]}

机构：

[1] Natl Renewable Energy Lab, Golden, CO 80401 USA

来源：

2010 INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM | 2010年

关键词：

Photovoltaic; Cadmium Telluride (CdTe); Capacitance Voltage Hysteresis; Transient Ion Drift (TID); Transient Capacitance; Deep Level Transient Spectroscopy (DLTS); DIFFUSION; CU;

D O I：

10.1109/IRPS.2010.5488811

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper we present the correlation of CdTe solar cell performance with capacitance-voltage hysteresis, defined presently as the difference in capacitance measured at zero-volt bias when collecting such data with different pre-measurement bias conditions. These correlations were obtained on CdTe cells stressed under conditions of 1-sun illumination, open-circuit bias, and an acceleration temperature of approximately 100 degrees C.

引用

页码：318 / 322

页数：5

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