3-D computational modeling of SiC epitaxial growth in a hot wall reactor

被引:4
作者
Ji, W [1 ]
Lofgren, PM
Hallin, C
Gu, CY
机构
[1] ABB Corp Res, SE-72178 Vasteras, Sweden
[2] Royal Inst Technol, Faxen Lab, SE-10044 Stockholm, Sweden
[3] Linkoping Univ, IFM, SE-58183 Linkoping, Sweden
来源
SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2 | 2000年 / 338-3卷
关键词
CVD; epitaxial growth; hot-wall; numerical simulation;
D O I
10.4028/www.scientific.net/MSF.338-342.149
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A three-dimensional computational model for chemical vapor deposition (CVD) of silicon carbide (SiC) in a hot wall reactor is developed, where the susceptor is tapered with a rectangular cross-section. The present work focuses on the advection-diffusion-reaction process in the susceptor. The precursors are propane and silane, and the carrier gas is hydrogen with mass fraction higher than 98%. Computed growth rates under different system pressures and precursor concentrations are compared with the experimental data measured on samples grown in the Linkoping CVD reactor. The gas composition distribution and the growth rate profile are shown. Dependence of the growth rate on precursor concentrations is investigated.
引用
收藏
页码:149 / 152
页数:4
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