The study of nanovolumes of amorphous materials using electron scattering

被引:96
作者
Cockayne, David J. H. [1 ]
机构
[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England
关键词
electron diffraction; radial distribution function (RDF); reduced density function; extended energy loss fine structure (EXELFS);
D O I
10.1146/annurev.matsci.35.082803.103337
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Many of the structural elements of importance in materials applications (e.g., thin films, barrier layers, intergranular films in ceramics) are small in volume and amorphous. Although the characterization of the structure of amorphous materials by X-ray and neutron diffraction methods is well established, these techniques are not suitable for studies of nanovolumes of materials because of the relatively small scattering cross sections. This chapter reviews recent developments in electron techniques, and particularly electron diffraction, for overcoming this problem.
引用
收藏
页码:159 / 187
页数:29
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